By Frank B. A. Früngel
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M) 8. MEASUREMENTS OF U L T R A L O W I N D U C T A N C E ( N H ) CAPACITORS 39 c. Rise Time of the Current The current rise time is 3 ^sec for each 3000-J unit with shorted output cables. The rise time of a complete system in operation is governed by the sum of load and internal inductance. The storage unit has to combine the following items: (a) Low-inductance storage capacitors of long lifetime; (b) System completely coaxial; (c) Switch tube housed in dry dielectric high-voltage-insulated coaxial housing with 70 nH inductance/3 kJ unit (including capacitor, housing, and cables to exit port); (d) Switch tube cooling providing either convection cooling in wellventilated cabinet, controlled forced air ducted into coaxial housing, or controlled and metered liquid coolant with thermal contact as switch tube; (e) High-current output available from high-voltage, low-inductance cables; length beyond cabinet porthole to be specified by customer; (f) Emergency discharge switch interlocked with all doors and panels and deenergized on power failure.
14 A W G insulated solid-copper wire. The load tap, to couple the test signal to the test capacitor, should include ^ 10% of the coil's turns. RF RMS VOLTMETER RF OSCILLATOR (VARIABLE OUTPUT) RF RMS VOLTMETER 3 TEST ^ CAPACITOR CURRENTTO-VOLTAGE CONVERTER FIG. A8-1. Block diagram of an arrangement for measuring the series-resonant properties of a capacitor. The current probe, the current-to-voltage converter, and its associated rf voltmeter, monitor the rf-current drive to the capacitor, so that the oscillator's output can be adjusted to maintain constant current as its frequency is varied.
The movable tap on the testcapacitor input lead provides a means for estabUshing whether or not a frequency that exhibits minimum-voltage response is the true resonant frequency. While maintaining a constant input-current level, the oscillator frequency is varied to determine the lowest frequency that exhibits a minimumvoltage indication across the test capacitor. , moved closer to the capacitor). If this next resonant frequency is higher, then the true resonant frequency is being approached. The procedure is repeated until the highest possible resonant frequency (in the fundamental mode) is obtained.